QUADRA is a high-throughput, in-line scanning probe metrology system with groundbreaking multi-miniaturized AFM head architecture to enable on-device, non-destructive three-dimensional (3D) metrology.
ROTTERDAM, Netherlands, Dec. 23, 2024 (GLOBE NEWSWIRE) -- Nearfield Instruments, a pioneer in advanced process control metrology solutions, is proud to announce that it has received repeat purchase ...
Results that may be inaccessible to you are currently showing.
Hide inaccessible results
Feedback