With 30 years of experience in SEM, David Edwards has contributed to advancements in novel detector technologies for SEM applications. He is an active member and affiliate of the Organization of ...

In the world of nanotechnology, where structures are measured in billionths of a meter, precise imaging and measurement techniques are essential. Critical Dimension Scanning Electron Microscopy ...

In EBSD analysis, backscattered electrons vary in their intensity and direction depending on the topography and composition of the specimen. The contrast of the backscattered electron image is based ...

According to [Asianometry], no one believed in the scanning electron microscope. No one, that is, except [Charles Oatley].The video below tells the whole story. The Cambridge graduate built radios ...

This article has been updated in January 2024. High resolution images of microscopic samples can be obtained experimentally using Scanning Electron Transmission Microscopy (STEM). It is an effective ...