JEOL Ltd. has launched HAXIS, a new low-angle ion-milling scanning electron microscope for semiconductor failure analysis, ...
JEOL (TSE:6951) has introduced its HAXIS low angle ion milling scanning electron microscope to the market, targeting semiconductor failure analysis workflows that rely on precise, repeatable defect ...
In a new study published in Nature, Saint Louis University School of Medicine researchers reveal an entirely unexpected ...
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AI reveals how coating thickness changes the link between surface roughness and pitting resistance
Localized pitting corrosion can cause sudden failure in aluminum components even when overall corrosion rates are low. Steam ...
Many things, small so far, are disappearing from Colorado College. There are fewer snacks in Armstrong Hall, the reception desk in the athletic center’s Great Hall is no longer staffed by ...
A new beam-shift-based 4D EMCD technique maps three-dimensional spin vectors at individual atomic planes and reveals ...
Researchers developed a chitosan-coated, manganese-doped bismuth ferrite nanoplatform that responds to acidic tumor ...
In this Power Corner interview, Thomas Rodgers, Head of Business Sector Electronics of Zeiss Microscopy, discusses failure ...
A new microscopic study of Türkiye's endemic knapweed Centaurea kirmacii reveals distinctive anatomical and pollen characters ...
The U.S. National Institutes of Health, or NIH, is also participating. It will provide access to biology datasets developed ...
A new type of advanced microscope (wide-field coherent multidimensional microscopy) has been developed. It uses a carefully ...
Biohub, the U.S. Department of Energy, the National Institutes of Health and private-sector partners have announced a coordinated $1.8 billion commitment of funding, data, computing resources and ...
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